• 1005 Citations
20012019

Research output per year

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Research Output

  • 1005 Citations
  • 25 Conference contribution
  • 8 Article
  • 2 Conference article
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Article
2019
2012

Exploring circuit timing-aware language and compilation

Hoang, G., Findler, R. B. & Joseph, R., Jun 1 2012, In : ACM SIGPLAN Notices. 47, 4, p. 345-355 11 p.

Research output: Contribution to journalArticle

Reliability modeling and management of nanophotonic on-chip networks

Li, Z., Mohamed, M., Chen, X., Dudley, E., Meng, K., Shang, L., Mickelson, A. R., Joseph, R. E., Vachharajani, M., Schwartz, B. & Sun, Y., Jan 1 2012, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 20, 1, p. 98-111 14 p., 5664817.

Research output: Contribution to journalArticle

59 Scopus citations

Virtual-machine-based emulation of future generation high-performance computing systems

Bridges, P. G., Arnold, D., Pedretti, K. T., Suresh, M., Lu, F., Dinda, P. A., Joseph, R. E. & Lange, J., May 1 2012, In : International Journal of High Performance Computing Applications. 26, 2, p. 125-135 11 p.

Research output: Contribution to journalArticle

5 Scopus citations
2010

A case for alternative nested paging models for virtualized systems

Hoang, G., Bae, C., Lange, J., Zhang, L., Dinda, P. A. & Joseph, R. E., Jan 1 2010, In : IEEE Computer Architecture Letters. 9, 1, p. 17-20 4 p., 5476385.

Research output: Contribution to journalArticle

9 Scopus citations

Exploiting locality to improve circuit-level timing speculation

Xin, J. & Joseph, R. E., Feb 1 2010, In : IEEE Computer Architecture Letters. 8, 2, p. 40-43 4 p., 5300797.

Research output: Contribution to journalArticle

2 Scopus citations
2008

Three-dimensional chip-multiprocessor run-time thermal management

Zhu, C., Gu, Z., Shang, L., Dick, R. P. & Joseph, R. E., Aug 1 2008, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 27, 8, p. 1479-1492 14 p., 4527121.

Research output: Contribution to journalArticle

153 Scopus citations
2007

Power, thermal, and reliability modeling in nanometer-scale microprocessors

Brooks, D., Dick, R. P., Joseph, R. E. & Shang, L., May 1 2007, In : IEEE Micro. 27, 3, p. 49-62 14 p.

Research output: Contribution to journalArticle

95 Scopus citations