This proposal introduces a “one fits all” solution concept for quantitative, fast, and precise 3D sensing of arbitrary scenes with mixed reflectance properties. The solution is based on well-known high-resolution 3D metrology principles but facilitates sophisticated evaluation algorithms and novel event-based sensor technology to measure complicated “real-world” scenes.
|Effective start/end date||4/1/22 → 8/14/22|
- National Science Foundation (IIS-2153516)
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