Atom-probe tomographic (APT) three-dimensionally resolved atom-by-atom time-of-flight mass spectrometric analysis of meteoritic and synthetic nanometer sized diamond particles, selected meteoritic grains such as SiC and graphite, and analogous terrestrial standard materials. For the LEAP analysis, the particles will be embedded in a metal matrix by ion-beam sputtering or a similar suitable deposition technique as needed. FIB will be used for region-of-interest targeting and APT tip preparation as needed.
|Effective start/end date||4/1/17 → 3/6/21|
- Washington University St. Louis (PO#2928922C/WU-18-16 Mod 3//NNX16AD26G)
- National Aeronautics and Space Administration (PO#2928922C/WU-18-16 Mod 3//NNX16AD26G)