MRI: Acquisition of a NanoRaman Atomic Force Microscopy (AFM) System for Multi-Property Measurements in Electronic and Other Materials

The objective of the Horiba NanoRaman-AFM system acquisition is to advance world-class research and education at Northwestern University by providing a versatile experimental platform for high-resolution multi-physics measurements in engineering and biological materials. The NanoRaman-AFM system integrates scanning probe microscopy with optical spectroscopy offering several attractive features for materials characterization namely, multiscale (macro-, micro, and nanoscale) sample analysis, fully automated operation, automated mapping and full optical microscope visualization in 3D confocal mode, high-optical collection efficiency, high-spectral resolution, nanoscale spectroscopic resolution, multi-technique and multi-environment (air and liquid) operation, and high mechanical robustness and stability. The system also offers an open architecture that permits future integration of ultrafast lasers to enable optical measurements with nanoscale spatial resolution and picosecond times resolution.