REU Site for Nanoscale Science and Engineering Center for Integrated Nanopatterning and Detection Technologies
- Hupp, Joseph T (Co-PD/PI)
- Seidman, David N (Co-PD/PI)
- Hirsch, Barton J (Co-PD/PI)
- Mirkin, Chad A (PD/PI)
- Nguyen, SonBinh (Co-PD/PI)
- Klein, William L (Co-PD/PI)
- Stupp, Samuel (Co-PD/PI)
- Espinosa, Horacio Dante (Co-PD/PI)
- Hersam, Mark (Co-PD/PI)
Project: Research project