Abstract
We have observed current-induced 1 f{hook} noise in thin copper crystals ("whiskers") ranging from 0.15 to 1.20 cm in length. We find that the noise power is proportional to the square of the applied d.c. voltage and has a power spectrum varying approximately as f{hook}-1 over the frequency range 0.5 Hz-2 kHz. The magnitude of the noise is 102-103 times larger than typical magnitudes reported for copper films of similar volume.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 679-681 |
| Number of pages | 3 |
| Journal | Solid State Communications |
| Volume | 21 |
| Issue number | 7 |
| DOIs | |
| State | Published - Feb 1977 |
Funding
which agrees in approximate magnitude with measurements on a number of metals. It has been suggested2’5 that the current-induced noise in metal films is generated by energy fluctuation in the sample which is weakly connected with a thermal reservoir at temperature T. Such fluctuations must of course depend strongly on the thermal boundary conditions and hence the role of the substrate in both the * work supported by NSF under contract NSF-DMR7S-14360 and by the Louis B. Block Fund of the Univer-sity of Chicago. We have also benefited from support of the Materials Research I.ab oratory by the NSF.
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- Materials Chemistry