1-bit memory using one electron: Parametric oscillations in a Penning trap

C. H. Tseng*, D. Enzer, G. Gabrielse, F. L. Walls

*Corresponding author for this work

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

The parametric oscillation of a single trapped electron is studied and used to measure enhanced spontaneous emission. Hysteresis in this motion provides a 1-bit memory to store information about excitations made with the electron "in the dark." The time dependence and stability criteria for the parametric excitation are examined. The cyclotron motions for one and two electrons are also studied.

Original languageEnglish (US)
Article number2094
Pages (from-to)2094-2104
Number of pages11
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume59
Issue number3
DOIs
StatePublished - Mar 1 1999

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traps
oscillations
electrons
spontaneous emission
excitation
time dependence
cyclotrons
hysteresis

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

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1-bit memory using one electron : Parametric oscillations in a Penning trap. / Tseng, C. H.; Enzer, D.; Gabrielse, G.; Walls, F. L.

In: Physical Review A - Atomic, Molecular, and Optical Physics, Vol. 59, No. 3, 2094, 01.03.1999, p. 2094-2104.

Research output: Contribution to journalArticle

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