1/f noise in metal films: The role of the substrate

P. Dutta*, J. W. Eberhard, P. M. Horn

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

We have examined the temperature dependence of voltage ("1/f") noise in Cu and Ag films on quartz and sapphire substrates. Our data suggest that two types of voltage noise occur simultaneously in metal films. One type of noise depends on the substrate and is weakly temperature-dependent; the remaining noise is strongly temperature-dependent and independent of the substrate.

Original languageEnglish (US)
Pages (from-to)1389-1391
Number of pages3
JournalSolid State Communications
Volume27
Issue number12
DOIs
StatePublished - Sep 1978

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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