3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy

E. Vasilyeva; Allen Taflove

doi:10.1109/APS.1998.701551

3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy

E. Vasilyeva^*, Allen Taflove

^*Corresponding author for this work

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

Tunnel scanning near-field optical microscopy (tunnel SNOM or TNOM) detects not only the regularly transmitted waves but also radiation coupled via evanescent waves to the classically forbidden directions (angles larger than the angle of total internal reflection). Forbidden light can, in general, provide images with higher contrast and resolution than those of allowed-light images. However, the full use of the forbidden-light information requires better understanding of the SNOM imaging process. While the multiple multipole method (MMP) has been proven to be useful for 2-D modeling of SNOM, it seems to be unsuitable for more realistic 3-D simulations due to difficulties in dealing with complicated inhomogeneous material geometries.

Original language	English (US)
Title of host publication	IEEE Antennas and Propagation Society International Symposium, 1998 Digest - Antennas
Subtitle of host publication	Gateways to the Global Network - Held in conjunction with: USNC/URSI National Radio Science Meeting
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1800-1803
Number of pages	4
Volume	4
ISBN (Print)	0780344782, 9780780344785
DOIs	https://doi.org/10.1109/APS.1998.701551
State	Published - Jan 1 1998
Event	1998 IEEE Antennas and Propagation Society International Symposium, APSURSI 1998 - Atlanta, United States Duration: Jun 21 1998 → Jun 26 1998

Other

Other	1998 IEEE Antennas and Propagation Society International Symposium, APSURSI 1998
Country/Territory	United States
City	Atlanta
Period	6/21/98 → 6/26/98

ASJC Scopus subject areas

Instrumentation
Radiation
Computer Networks and Communications
Electrical and Electronic Engineering

Access to Document

10.1109/APS.1998.701551

Cite this

Vasilyeva, E., & Taflove, A. (1998). 3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy. In IEEE Antennas and Propagation Society International Symposium, 1998 Digest - Antennas: Gateways to the Global Network - Held in conjunction with: USNC/URSI National Radio Science Meeting (Vol. 4, pp. 1800-1803). [701551] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APS.1998.701551

Vasilyeva, E. ; Taflove, Allen. / 3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy. IEEE Antennas and Propagation Society International Symposium, 1998 Digest - Antennas: Gateways to the Global Network - Held in conjunction with: USNC/URSI National Radio Science Meeting. Vol. 4 Institute of Electrical and Electronics Engineers Inc., 1998. pp. 1800-1803

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abstract = "Tunnel scanning near-field optical microscopy (tunnel SNOM or TNOM) detects not only the regularly transmitted waves but also radiation coupled via evanescent waves to the classically forbidden directions (angles larger than the angle of total internal reflection). Forbidden light can, in general, provide images with higher contrast and resolution than those of allowed-light images. However, the full use of the forbidden-light information requires better understanding of the SNOM imaging process. While the multiple multipole method (MMP) has been proven to be useful for 2-D modeling of SNOM, it seems to be unsuitable for more realistic 3-D simulations due to difficulties in dealing with complicated inhomogeneous material geometries.",

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Vasilyeva, E & Taflove, A 1998, 3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy. in IEEE Antennas and Propagation Society International Symposium, 1998 Digest - Antennas: Gateways to the Global Network - Held in conjunction with: USNC/URSI National Radio Science Meeting. vol. 4, 701551, Institute of Electrical and Electronics Engineers Inc., pp. 1800-1803, 1998 IEEE Antennas and Propagation Society International Symposium, APSURSI 1998, Atlanta, United States, 6/21/98. https://doi.org/10.1109/APS.1998.701551

3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy. / Vasilyeva, E.; Taflove, Allen.
IEEE Antennas and Propagation Society International Symposium, 1998 Digest - Antennas: Gateways to the Global Network - Held in conjunction with: USNC/URSI National Radio Science Meeting. Vol. 4 Institute of Electrical and Electronics Engineers Inc., 1998. p. 1800-1803 701551.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - Tunnel scanning near-field optical microscopy (tunnel SNOM or TNOM) detects not only the regularly transmitted waves but also radiation coupled via evanescent waves to the classically forbidden directions (angles larger than the angle of total internal reflection). Forbidden light can, in general, provide images with higher contrast and resolution than those of allowed-light images. However, the full use of the forbidden-light information requires better understanding of the SNOM imaging process. While the multiple multipole method (MMP) has been proven to be useful for 2-D modeling of SNOM, it seems to be unsuitable for more realistic 3-D simulations due to difficulties in dealing with complicated inhomogeneous material geometries.

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Vasilyeva E, Taflove A. 3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy. In IEEE Antennas and Propagation Society International Symposium, 1998 Digest - Antennas: Gateways to the Global Network - Held in conjunction with: USNC/URSI National Radio Science Meeting. Vol. 4. Institute of Electrical and Electronics Engineers Inc. 1998. p. 1800-1803. 701551 doi: 10.1109/APS.1998.701551

3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy

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