4Pi spectral self-interference fluorescence microscopy

Mehmet Dogan, Bennett B. Goldberg, Anna K. Swan, M. Selim Ünlü

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Spectral Self-interference Fluorescence Microscopy using two opposing high numerical aperture objectives is proposed to precisely measure the axial position of fluorescent emitters. 5 nm change in the position of monolayer of fluorescent emitters was measured.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FiO 2006
PublisherOptical Society of America
ISBN (Print)1557528187, 9781557528186
StatePublished - Jan 1 2006
EventFrontiers in Optics, FiO 2006 - Rochester, NY, United States
Duration: Oct 10 2006Oct 10 2006

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701


OtherFrontiers in Optics, FiO 2006
Country/TerritoryUnited States
CityRochester, NY

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics


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