A compact dual-purpose camera for shearography and electronic speckle-pattern interferometry

Pavel A. Fomitchov*, Sridhar Krishnaswamy

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

A dual-purpose camera for both shearography and electronic speckle-pattern interferometry (ESPI) based on the concept of additive-subtractive phase-modulated speckle interferometry has been designed and tested. The compact camera can be operated either in ESPI mode or in shearography mode by simply adjusting a moving mirror in the camera head. This camera has been designed as an optical part of an automatic inspection system for disbond detection in aircraft structures. The primary advantage is the possibility of obtaining information both about an object's displacement and about its gradient using a single low-cost device suitable for field applications.

Original languageEnglish (US)
Pages (from-to)581-583
Number of pages3
JournalMeasurement Science and Technology
Volume8
Issue number5
DOIs
StatePublished - Jan 1 1997

ASJC Scopus subject areas

  • Instrumentation
  • Applied Mathematics

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