Abstract
A compact optical device, which is a combination of a polariscope and a shearing interferometer (PSI), is described for mapping stress fields in bimaterial systems. The PSI device uses commercially available wave plates, and a calcite crystal for beam duplicating. It can operate in a variety of modes, including as a circular polariscope and as a shearing interferometer. In its polariscope mode, it can be used on birefringent materials such as Homolite and epoxy; in its shearing mode, it can be used on optically isotropic materials such as polymethylmethacrylate (PMMA) and glass. As an example, the device is used to obtain full-field maps of stress fields in the vicinity of an interfacial crack in an epoxy-PMMA bimaterial plate.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 404-411 |
| Number of pages | 8 |
| Journal | Experimental Mechanics |
| Volume | 36 |
| Issue number | 4 |
| DOIs | |
| State | Published - Dec 1996 |
ASJC Scopus subject areas
- Aerospace Engineering
- Mechanics of Materials
- Mechanical Engineering