A convenient and rapid sample repositioning approach for atomic force microscopy

A novel repositioning approach is described for repeated observations of a specimen at a close proximal location in the atomic force microscope. The approach is similar to keystone architecture, whereby the repositioning is achieved by forming a male structured base for the specimen, and a corresponding female counterpart as the frame. For the combination of an acrylic acid frame and a metal base, 90% translation shifts are less than 10 μm, and almost all angular disorientations are within +3° to -3°. Nanometre-scale surface features can be relocated easily and reliably even after 40 imaging-removal- imaging cycles, dipping the specimen in solutions or heating up to 500°C.