A convenient and rapid sample repositioning approach for atomic force microscopy

M. Su, Z. Pan, Vinayak P. Dravid*

*Corresponding author for this work

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

A novel repositioning approach is described for repeated observations of a specimen at a close proximal location in the atomic force microscope. The approach is similar to keystone architecture, whereby the repositioning is achieved by forming a male structured base for the specimen, and a corresponding female counterpart as the frame. For the combination of an acrylic acid frame and a metal base, 90% translation shifts are less than 10 μm, and almost all angular disorientations are within +3° to -3°. Nanometre-scale surface features can be relocated easily and reliably even after 40 imaging-removal- imaging cycles, dipping the specimen in solutions or heating up to 500°C.

Original languageEnglish (US)
Pages (from-to)194-196
Number of pages3
JournalJournal of Microscopy
Volume216
Issue number2
DOIs
StatePublished - Nov 1 2004

Keywords

  • AFM
  • Atomic force microscope
  • Fabrication
  • Lithography
  • Reposition
  • Sample

ASJC Scopus subject areas

  • Pathology and Forensic Medicine
  • Histology

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