A framework for supervised and unsupervised segmentation and classification of materials microstructure images

Kungang Zhang, Wei Chen, Wing Kam Liu, L. Catherine Brinson, Daniel W. Apley*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Microstructure of materials is often characterized through image analysis to understand processing-structure-properties linkages. We propose a largely automated framework that integrates unsupervised and supervised learning methods to classify micrographs according to microstructure phase/class and, for multiphase microstructures, segments them into different homogeneous regions. With the advance of manufacturing and imaging techniques, the ultra-high resolution of imaging that reveals the complexity of microstructures and the rapidly increasing quantity of images (i.e., micrographs) enables and necessitates a more powerful and automated framework to extract material characteristics and knowledge. The framework we propose can be used to gradually build a database of microstructure classes relevant to a particular process or group of materials, which can help in analyzing and discovering/identifying new materials. The framework has three steps: (1) preliminary, segmentation of multiphase micrographs so that different microstructure homogeneous regions can be identified in an unsupervised manner; (2) identification and classification of homogeneous regions of micrographs through an uncertainty-aware supervised classification network trained using the segmented micrographs from Step 1 with their identified labels verified via the built-in uncertainty quantification and minimal human inspection; (3) subsequent supervised segmentation (more powerful than the segmentation in Step 1) of multiphase microstructures through a segmentation network trained with micrographs and the results from Steps 1–2 using a form of data augmentation. This framework can iteratively characterize/segment new homogeneous or multiphase materials while expanding the database to enhance performance. The framework is demonstrated on various sets of materials and texture images.

Original languageEnglish (US)
Article number121588
JournalActa Materialia
Volume301
DOIs
StatePublished - Dec 1 2025

Funding

This research work was partially supported by the Air Force Office of Scientific Research, USA under grants FA9550-14-1-0032 and FA9550-18-1-0381, for which we express our sincere gratitude. Additionally, this work was also supported by funded resources from the Extreme Science and Engineering Discovery Environment (XSEDE), USA [75] (NSF grant ACI-1548562) and the Advanced Cyberinfrastructure Coordination Ecosystem: Services & Support (ACCESS) program, USA [76] (NSF grants 2138259, 2138286, 2138307, 2137603, and 2138296). Further computational resources were provided by the Quest high-performance computing facility at Northwestern University, which is jointly supported by the Office of the Provost, USA, the Office for Research, USA, and Northwestern University Information Technology, USA . The micrographs of silica particles in PMMA are kindly provided by Prof. Linda Schadler ([email protected]).

Keywords

  • Data augmentation
  • Evidential deep learning
  • Fisher score vector
  • Microstructure
  • Segmentation network

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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