A high temperature apparatus for measurement of the Seebeck coefficient

Shiho Iwanaga*, Eric S. Toberer, Aaron Lalonde, G. Jeffrey Snyder

*Corresponding author for this work

Research output: Contribution to journalArticle

182 Scopus citations

Abstract

A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.

Original languageEnglish (US)
Article number063905
JournalReview of Scientific Instruments
Volume82
Issue number6
DOIs
StatePublished - Jun 1 2011

ASJC Scopus subject areas

  • Instrumentation

Fingerprint Dive into the research topics of 'A high temperature apparatus for measurement of the Seebeck coefficient'. Together they form a unique fingerprint.

  • Cite this