A high temperature apparatus for measurement of the Seebeck coefficient

Shiho Iwanaga; Eric S. Toberer; Aaron Lalonde; G. Jeffrey Snyder

doi:10.1063/1.3601358

A high temperature apparatus for measurement of the Seebeck coefficient

Shiho Iwanaga^*, Eric S. Toberer, Aaron Lalonde, G. Jeffrey Snyder

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

256 Scopus citations

Abstract

A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.

Original language	English (US)
Article number	063905
Journal	Review of Scientific Instruments
Volume	82
Issue number	6
DOIs	https://doi.org/10.1063/1.3601358
State	Published - Jun 2011

ASJC Scopus subject areas

Instrumentation

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10.1063/1.3601358

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title = "A high temperature apparatus for measurement of the Seebeck coefficient",

abstract = "A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.",

author = "Shiho Iwanaga and Toberer, {Eric S.} and Aaron Lalonde and Snyder, {G. Jeffrey}",

year = "2011",

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AB - A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.

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A high temperature apparatus for measurement of the Seebeck coefficient

Abstract

ASJC Scopus subject areas

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