A high-throughput technique for determining grain boundary character non-destructively in microstructures with through-thickness grains

Matteo Seita*, Marco Volpi, Srikanth Patala, Ian McCue, Christopher A. Schuh, Maria Vittoria Diamanti, Jonah Erlebacher, Michael J. Demkowicz

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Grain boundaries (GBs) govern many properties of polycrystalline materials. However, because of their structural variability, our knowledge of GB constitutive relations is still very limited. We present a novel method to characterise the complete crystallography of individual GBs non-destructively, with high-throughput, and using commercially available tools. This method combines electron diffraction, optical reflectance and numerical image analysis to determine all five crystallographic parameters of numerous GBs in samples with through-thickness grains. We demonstrate the technique by measuring the crystallographic character of about 1,000 individual GBs in aluminum in a single run. Our method enables cost- and time-effective assembly of crystallography-property databases for thousands of individual GBs. Such databases are essential for identifying GB constitutive relations and for predicting GB-related behaviours of polycrystalline solids.

Original languageEnglish (US)
Article number16016
Journalnpj Computational Materials
Volume2
DOIs
StatePublished - Jun 24 2016
Externally publishedYes

ASJC Scopus subject areas

  • Modeling and Simulation
  • Materials Science(all)
  • Mechanics of Materials
  • Computer Science Applications

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