Keyphrases
Transmission Electron Microscopy
100%
Nanowires
100%
Plan-view
100%
Cross-sectional View
100%
Individual Nanostructures
100%
Region of Interest
40%
Dual-beam
40%
Focused Ion Beam
40%
Lift-off
40%
Crystal Defects
40%
Specimen Preparation
20%
Nanostructures
20%
Nanoparticles
20%
Target Position
20%
In Situ
20%
Deposition Layer
20%
Defected Ground Structure
20%
Patterned Thin Films
20%
Transparent Samples
20%
3D Analysis
20%
Individual Nanowire
20%
Cross-sectional Transmission Electron Microscopy
20%
Viewing Angle
20%
Silicon Nanowires (SiNWs)
20%
Impurity Atoms
20%
Transmission Electron Microscopy Images
20%
Transmission Electron Microscopy Analysis
20%
Carbon Nitride
20%
Si Nitride
20%
Sample Support
20%
Electron Transparency
20%
Quasi-3-D
20%
Engineering
Nanomaterial
100%
Plan View
100%
Sectional View
100%
Nanowire
100%
Focused Ion Beam
33%
Region of Interest
33%
Nitride
16%
Direct Correlation
16%
Target Position
16%
Si Nanowires
16%
Nanoparticles
16%
3D Analysis
16%
Thin Films
16%
Defect Structure
16%
Material Science
Nanostructure
100%
Nanowires
100%
Transmission Electron Microscopy
100%
Focused Ion Beam
28%
Nitride Compound
14%
Electron Microscopy
14%
Thin Films
14%
Nanoparticle
14%
Crystal Defect
14%