Abstract
In situ electron microscopy tensile tests of nanowires and carbon nanotubes performed using a MEMS-based material testing system are reported. The development of the material testing system (previously reported elsewhere 23-26) is briefly reviewed. This system, consisting of a surface micromachined actuator and load sensor, makes possible continuous observation of specimen deformation and failure with sub-nanometer resolution, while simultaneously measuring the applied load electronically with nanonewton resolution. This letter begins with a brief review of some of the methods used in mechanical characterization of nanoscale specimens, followed by a description of the MEMS-based material testing system. Finally, emphasis is placed on experimental results demonstrating the advantages of the MEMS-based system.
Original language | English (US) |
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Pages (from-to) | 76-87 |
Number of pages | 12 |
Journal | Sensor Letters |
Volume | 6 |
Issue number | 1 |
DOIs | |
State | Published - Feb 2008 |
Externally published | Yes |
Keywords
- Carbon nanotube
- Material testing
- Nanowire
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering