Abstract
Methods of determining the phases for noisy and incomplete surface diffraction data (X-ray or transmission electron) are investigated. It is found that while conventional methods do not always work, a minimum-entropy method that uses the relative entropy is more effective in finding the correct solutions.
Original language | English (US) |
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Pages (from-to) | 296-305 |
Number of pages | 10 |
Journal | Acta Crystallographica Section A: Foundations of Crystallography |
Volume | 54 |
Issue number | 3 |
DOIs | |
State | Published - May 1 1998 |
ASJC Scopus subject areas
- Structural Biology