A next-generation in-situ nanoprobe beamline for the advanced photon source

Jörg Maser, Barry Lai, Tonio Buonassisi, Zhonghou Cai, Si Chen, Lydia Finney, Sophie Charlotte Gleber, Ross Harder, Chris Jacobsen, Wenjun Liu, Conal Murray, Curt Preissner, Chris Roehrig, Volker Rose, Deming Shu, David Vine, Stefan Vogt

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations


The Advanced Photon Source is currently developing a suite of new hard x-ray beamlines, aimed primarily at the study of materials and devices under real conditions. One of the flagship beamlines of the APS Upgrade is the In-Situ Nanoprobe beamline (ISN beamline), which will provide in-situ and operando characterization of advanced energy materials and devices under change of temperature and gases, under applied fields, in 3D. The ISN beamline is designed to deliver spatially coherent x-rays with photon energies between 4 keV and 30 keV to the ISN instrument. As an x-ray source, a revolver-type undulator with two interchangeable magnetic structures, optimized to provide high brilliance throughout the range of photon energies of 4 keV - 30 keV, will be used. The ISN instrument will provide a smallest hard x-ray spot of 20 nm using diffractive optics, with sensitivity to sub-10 nm sample structures using coherent diffraction. Using nanofocusing mirrors in Kirkpatrick-Baez geometry, the ISN will also provide a focus of 50 nm with a flux of 8 1011 Photons/s at a photon energy of 10 keV, several orders of magnitude larger than what is currently available. This will allow imaging of trace amounts of most elements in the periodic table, with a sensitivity to well below 100 atoms for most metals in thin samples. It will also enable nanospectroscopic studies of the chemical state of most materials relevant to energy science. The ISN beamline will be primarily used to study inorganic and organic photovoltaic systems, advanced batteries and fuel cells, nanoelectronics devices, and materials and systems designed to reduce the environmental impact of combustion.

Original languageEnglish (US)
Title of host publicationX-Ray Nanoimaging
Subtitle of host publicationInstruments and Methods
ISBN (Print)9780819497017
StatePublished - 2013
EventX-Ray Nanoimaging: Instruments and Methods - San Diego, CA, United States
Duration: Aug 28 2013Aug 29 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherX-Ray Nanoimaging: Instruments and Methods
Country/TerritoryUnited States
CitySan Diego, CA


  • Energy science
  • Materials science
  • Nanofocusing
  • X-ray
  • X-ray nanoprobe
  • X-ray optics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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