TY - GEN
T1 - A next-generation in-situ nanoprobe beamline for the advanced photon source
AU - Maser, Jörg
AU - Lai, Barry
AU - Buonassisi, Tonio
AU - Cai, Zhonghou
AU - Chen, Si
AU - Finney, Lydia
AU - Gleber, Sophie Charlotte
AU - Harder, Ross
AU - Jacobsen, Chris
AU - Liu, Wenjun
AU - Murray, Conal
AU - Preissner, Curt
AU - Roehrig, Chris
AU - Rose, Volker
AU - Shu, Deming
AU - Vine, David
AU - Vogt, Stefan
N1 - Copyright:
Copyright 2014 Elsevier B.V., All rights reserved.
PY - 2013
Y1 - 2013
N2 - The Advanced Photon Source is currently developing a suite of new hard x-ray beamlines, aimed primarily at the study of materials and devices under real conditions. One of the flagship beamlines of the APS Upgrade is the In-Situ Nanoprobe beamline (ISN beamline), which will provide in-situ and operando characterization of advanced energy materials and devices under change of temperature and gases, under applied fields, in 3D. The ISN beamline is designed to deliver spatially coherent x-rays with photon energies between 4 keV and 30 keV to the ISN instrument. As an x-ray source, a revolver-type undulator with two interchangeable magnetic structures, optimized to provide high brilliance throughout the range of photon energies of 4 keV - 30 keV, will be used. The ISN instrument will provide a smallest hard x-ray spot of 20 nm using diffractive optics, with sensitivity to sub-10 nm sample structures using coherent diffraction. Using nanofocusing mirrors in Kirkpatrick-Baez geometry, the ISN will also provide a focus of 50 nm with a flux of 8 1011 Photons/s at a photon energy of 10 keV, several orders of magnitude larger than what is currently available. This will allow imaging of trace amounts of most elements in the periodic table, with a sensitivity to well below 100 atoms for most metals in thin samples. It will also enable nanospectroscopic studies of the chemical state of most materials relevant to energy science. The ISN beamline will be primarily used to study inorganic and organic photovoltaic systems, advanced batteries and fuel cells, nanoelectronics devices, and materials and systems designed to reduce the environmental impact of combustion.
AB - The Advanced Photon Source is currently developing a suite of new hard x-ray beamlines, aimed primarily at the study of materials and devices under real conditions. One of the flagship beamlines of the APS Upgrade is the In-Situ Nanoprobe beamline (ISN beamline), which will provide in-situ and operando characterization of advanced energy materials and devices under change of temperature and gases, under applied fields, in 3D. The ISN beamline is designed to deliver spatially coherent x-rays with photon energies between 4 keV and 30 keV to the ISN instrument. As an x-ray source, a revolver-type undulator with two interchangeable magnetic structures, optimized to provide high brilliance throughout the range of photon energies of 4 keV - 30 keV, will be used. The ISN instrument will provide a smallest hard x-ray spot of 20 nm using diffractive optics, with sensitivity to sub-10 nm sample structures using coherent diffraction. Using nanofocusing mirrors in Kirkpatrick-Baez geometry, the ISN will also provide a focus of 50 nm with a flux of 8 1011 Photons/s at a photon energy of 10 keV, several orders of magnitude larger than what is currently available. This will allow imaging of trace amounts of most elements in the periodic table, with a sensitivity to well below 100 atoms for most metals in thin samples. It will also enable nanospectroscopic studies of the chemical state of most materials relevant to energy science. The ISN beamline will be primarily used to study inorganic and organic photovoltaic systems, advanced batteries and fuel cells, nanoelectronics devices, and materials and systems designed to reduce the environmental impact of combustion.
KW - Energy science
KW - Materials science
KW - Nanofocusing
KW - X-ray
KW - X-ray nanoprobe
KW - X-ray optics
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U2 - 10.1117/12.2026418
DO - 10.1117/12.2026418
M3 - Conference contribution
AN - SCOPUS:84888176162
SN - 9780819497017
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - X-Ray Nanoimaging
PB - SPIE
T2 - X-Ray Nanoimaging: Instruments and Methods
Y2 - 28 August 2013 through 29 August 2013
ER -