A note on compositionally modulated Cu-Ni films with lattice-commensurate wavelengths

N. K. Flevaris; D. Baral; J. B. Ketterson; J. E. Hilliard

doi:10.1063/1.92224

A note on compositionally modulated Cu-Ni films with lattice-commensurate wavelengths

N. K. Flevaris^*, D. Baral, J. B. Ketterson, J. E. Hilliard

^*Corresponding author for this work

MRC - Materials Research Center

Research output: Contribution to journal › Article › peer-review

40 Scopus citations

Abstract

It has been found that the number and sharpness of the x-ray satellite peaks from Cu-Ni films containing short-wavelength (0.6-11.4 nm) composition modulations (produced by vapor deposition) were strongly dependent on the degree to which the number of monolayers of the components in each period approached integer values. It is demonstrated that this is an important factor in accounting for the difference that has previously been observed between the x-ray spectra from modulated metallic and semi-conductor films.

Original language	English (US)
Pages (from-to)	992-994
Number of pages	3
Journal	Applied Physics Letters
Volume	38
Issue number	12
DOIs	https://doi.org/10.1063/1.92224
State	Published - 1981

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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abstract = "It has been found that the number and sharpness of the x-ray satellite peaks from Cu-Ni films containing short-wavelength (0.6-11.4 nm) composition modulations (produced by vapor deposition) were strongly dependent on the degree to which the number of monolayers of the components in each period approached integer values. It is demonstrated that this is an important factor in accounting for the difference that has previously been observed between the x-ray spectra from modulated metallic and semi-conductor films.",

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T1 - A note on compositionally modulated Cu-Ni films with lattice-commensurate wavelengths

AU - Flevaris, N. K.

AU - Baral, D.

AU - Ketterson, J. B.

AU - Hilliard, J. E.

PY - 1981

Y1 - 1981

N2 - It has been found that the number and sharpness of the x-ray satellite peaks from Cu-Ni films containing short-wavelength (0.6-11.4 nm) composition modulations (produced by vapor deposition) were strongly dependent on the degree to which the number of monolayers of the components in each period approached integer values. It is demonstrated that this is an important factor in accounting for the difference that has previously been observed between the x-ray spectra from modulated metallic and semi-conductor films.

AB - It has been found that the number and sharpness of the x-ray satellite peaks from Cu-Ni films containing short-wavelength (0.6-11.4 nm) composition modulations (produced by vapor deposition) were strongly dependent on the degree to which the number of monolayers of the components in each period approached integer values. It is demonstrated that this is an important factor in accounting for the difference that has previously been observed between the x-ray spectra from modulated metallic and semi-conductor films.

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JF - Applied Physics Letters

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A note on compositionally modulated Cu-Ni films with lattice-commensurate wavelengths

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