A p chart for monitoring capability using sensitivity data

Bruce E. Ankenman*, William R. McDaniel

*Corresponding author for this work

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

A control chart is proposed for monitoring the capability of a process when sensitivity data are all that are available on a particular measure of interest, such as the threshold height at which a dropped bottle will break. Sensitivity data are data that are collected as either pass or fail of a sample at a certain level exposure to a control variable, such as drop height. Methodology is presented for selecting a certain quantile of the distribution of the measure of interest and monitoring that quantile with a standard p chart. The trade-offs between increasing the power of the control chart and decreasing the number of measurements are explored.

Original languageEnglish (US)
Pages (from-to)463-469
Number of pages7
JournalQuality Engineering
Volume12
Issue number3
DOIs
StatePublished - Jan 1 2000

Keywords

  • Binomial distribution
  • Destructive testing
  • Power of the test
  • Statistical process control

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Industrial and Manufacturing Engineering

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