A statistical field model for pedestrian detection

Ying Wu*, Ting Yu, Gang Hua

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

27 Scopus citations

Abstract

This paper presents a new statistical model for detecting and tracking deformable objects such as pedestrians, where large shape variations induced by local shape deformation can not be well captured by global methods such as PCA. The proposed model employs a Boltzmann distribution to capture the prior of local deformation, and embeds it into a Markov network which can be learned from data. A mean field va national analysis of this model provides computationally efficient algorithms for computing the likeli-hood of image observations and facilitate fast model training. Based on that, effective detection and tracking algorithms for deformable objects are proposed and applied to pedestrian detection and tracking. The proposed method has several advantages. Firstly, it captures local deformation well and thus is robust to occlusions and clutter. In addition, it is computationally tractable. Moreover, it divides deformation into local deformation and global deformation, then conquers them by combining bottom-up and top-down methodologies. Extensive experiments demonstrate the effectiveness of the proposed model for deformable objects.

Original languageEnglish (US)
Title of host publicationProceedings - 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005
PublisherIEEE Computer Society
Pages1023-1030
Number of pages8
ISBN (Print)0769523722, 9780769523729
DOIs
StatePublished - 2005
Event2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005 - San Diego, CA, United States
Duration: Jun 20 2005Jun 25 2005

Publication series

NameProceedings - 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005
VolumeI

Other

Other2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005
CountryUnited States
CitySan Diego, CA
Period6/20/056/25/05

ASJC Scopus subject areas

  • Engineering(all)

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