A thermally actuated three-probe nanomanipulator for efficient handling of individual nanostructures

Xuefeng Wang*, Loren Vincent, Yu Minfeng, Yonggang Huang, Chang Liu

*Corresponding author for this work

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

We report recent development of a three-probe micromachined nanomanipulator for manipulation and in-situ characterization of nanomaterials in scanning electron microscope (SEM). The nanomanipulator consists of three independent probes having thermal bimetallic actuators and nanoscopic end-effectors. Nanoscale end-effectors with sub-100-nm spacing are created using focused ion beam (FIB) milling to directly interface with nanoscopic objects (e.g., nanotubes, nanowires). Handling of individual carbon nanotubes (CNTs) was successfully realized with the nanomanipulator in an SEM.

Original languageEnglish (US)
Pages (from-to)442-445
Number of pages4
JournalProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
StatePublished - Jul 19 2004
Event17th IEEE International Conference on Micro Electro Mechanical Systems (MEMS): Maastricht MEMS 2004 Technical Digest - Maastricht, Netherlands
Duration: Jan 25 2004Jan 29 2004

Fingerprint

end effectors
End effectors
Nanostructures
Electron microscopes
electron microscopes
Scanning
Carbon Nanotubes
scanning
probes
Focused ion beams
Nanostructured materials
Nanotubes
Nanowires
manipulators
Carbon nanotubes
nanotubes
nanowires
Actuators
actuators
ion beams

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

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title = "A thermally actuated three-probe nanomanipulator for efficient handling of individual nanostructures",
abstract = "We report recent development of a three-probe micromachined nanomanipulator for manipulation and in-situ characterization of nanomaterials in scanning electron microscope (SEM). The nanomanipulator consists of three independent probes having thermal bimetallic actuators and nanoscopic end-effectors. Nanoscale end-effectors with sub-100-nm spacing are created using focused ion beam (FIB) milling to directly interface with nanoscopic objects (e.g., nanotubes, nanowires). Handling of individual carbon nanotubes (CNTs) was successfully realized with the nanomanipulator in an SEM.",
author = "Xuefeng Wang and Loren Vincent and Yu Minfeng and Yonggang Huang and Chang Liu",
year = "2004",
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language = "English (US)",
pages = "442--445",
journal = "Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)",
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A thermally actuated three-probe nanomanipulator for efficient handling of individual nanostructures. / Wang, Xuefeng; Vincent, Loren; Minfeng, Yu; Huang, Yonggang; Liu, Chang.

In: Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS), 19.07.2004, p. 442-445.

Research output: Contribution to journalConference article

TY - JOUR

T1 - A thermally actuated three-probe nanomanipulator for efficient handling of individual nanostructures

AU - Wang, Xuefeng

AU - Vincent, Loren

AU - Minfeng, Yu

AU - Huang, Yonggang

AU - Liu, Chang

PY - 2004/7/19

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N2 - We report recent development of a three-probe micromachined nanomanipulator for manipulation and in-situ characterization of nanomaterials in scanning electron microscope (SEM). The nanomanipulator consists of three independent probes having thermal bimetallic actuators and nanoscopic end-effectors. Nanoscale end-effectors with sub-100-nm spacing are created using focused ion beam (FIB) milling to directly interface with nanoscopic objects (e.g., nanotubes, nanowires). Handling of individual carbon nanotubes (CNTs) was successfully realized with the nanomanipulator in an SEM.

AB - We report recent development of a three-probe micromachined nanomanipulator for manipulation and in-situ characterization of nanomaterials in scanning electron microscope (SEM). The nanomanipulator consists of three independent probes having thermal bimetallic actuators and nanoscopic end-effectors. Nanoscale end-effectors with sub-100-nm spacing are created using focused ion beam (FIB) milling to directly interface with nanoscopic objects (e.g., nanotubes, nanowires). Handling of individual carbon nanotubes (CNTs) was successfully realized with the nanomanipulator in an SEM.

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JO - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)

JF - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)

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