A time-of-flight atom-probe field-ion microscope for the study of defects in metals

Thomas M. Hall1; Alfred Wagner; Arnold S. Berger; David N. Seidman

doi:10.1016/0036-9748(76)90178-2

A time-of-flight atom-probe field-ion microscope for the study of defects in metals

Thomas M. Hall1^*, Alfred Wagner, Arnold S. Berger, David N. Seidman

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of applying the evaporation pulse to the FIM specimen, measuring the dc and the pulse voltages, and analyzing the TOF data is controlled by a Nova 1220 computer. With this automated system we can presently record and analyze 600 TOF events min^-1.

Original language	English (US)
Pages (from-to)	485-488
Number of pages	4
Journal	Scripta Metallurgica
Volume	10
Issue number	5
DOIs	https://doi.org/10.1016/0036-9748(76)90178-2
State	Published - May 1976

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Engineering(all)

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10.1016/0036-9748(76)90178-2

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title = "A time-of-flight atom-probe field-ion microscope for the study of defects in metals",

abstract = "An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of applying the evaporation pulse to the FIM specimen, measuring the dc and the pulse voltages, and analyzing the TOF data is controlled by a Nova 1220 computer. With this automated system we can presently record and analyze 600 TOF events min-1.",

author = "Hall1, {Thomas M.} and Alfred Wagner and Berger, {Arnold S.} and Seidman, {David N.}",

year = "1976",

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doi = "10.1016/0036-9748(76)90178-2",

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T1 - A time-of-flight atom-probe field-ion microscope for the study of defects in metals

AU - Hall1, Thomas M.

AU - Wagner, Alfred

AU - Berger, Arnold S.

AU - Seidman, David N.

PY - 1976/5

Y1 - 1976/5

N2 - An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of applying the evaporation pulse to the FIM specimen, measuring the dc and the pulse voltages, and analyzing the TOF data is controlled by a Nova 1220 computer. With this automated system we can presently record and analyze 600 TOF events min-1.

AB - An ultra-high vacuum time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. Performance experiments show that this instrument can clearly resolve the seven stable isotopes of molybdenum, the five stable isotopes of tungsten, and the two stable isotopes of rhenium in a tungsten-25at.% rhenium alloy. The entire process of applying the evaporation pulse to the FIM specimen, measuring the dc and the pulse voltages, and analyzing the TOF data is controlled by a Nova 1220 computer. With this automated system we can presently record and analyze 600 TOF events min-1.

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JO - Scripta Materialia

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A time-of-flight atom-probe field-ion microscope for the study of defects in metals

Abstract

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