A tri-layer approach to controlling nanopore formation in oxide supports

Abha A. Gosavi, James L. Hedrick, Peng Cheng Chen, Justin M. Notestein*, Chad A. Mirkin

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

A novel tri-layer approach for immobilizing metal nanoparticles in SiO 2 supports is presented. In this work, we show that under rapid heating to temperatures of approximately 1,000 °C, metal nanoparticles less than 15 nm in size will entrench in the SiO 2 layer on a silicon wafer to create pores as deep as 250 nm. We studied and characterized this entrenching behavior and subsequent nanopore formation for a wide variety of metal nanoparticles, including Au, Ag, Pt, Pd, and Cu. We also demonstrate that an Al 2 O 3 layer acts as a barrier to such pore formation. Thus, by creating a tri-layer architecture consisting of SiO 2 on Al 2 O 3 on silicon wafers, we can control the depth to which nanoparticles entrench between 3–5 nm. This small range allows one to entrench particles for the purpose of immobilization but still present them above the surface. The two advances of moving into the sub-15 nm size regime and of controlled particle immobilization through entrenchment have important implications in studying site-isolated and stabilized metal nanoparticles for applications in sensing, separations, and catalysis. [Figure not available: see fulltext.].

Original languageEnglish (US)
JournalNano Research
DOIs
StatePublished - Jan 1 2019

Keywords

  • Au nanoparticles
  • atomic force microscopy
  • nanoparticle entrenchment
  • nanoparticle stabilization
  • nanopore formation

ASJC Scopus subject areas

  • Materials Science(all)
  • Electrical and Electronic Engineering

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