Abstract
The imaging quality of an aplanatic SIL microscope is shown to be significantly degraded by aberrations, especially when the samples have thicknesses that are more than a few micrometers thicker or thinner than the design thickness. Aberration due to the sample thickness error is modeled and compared with measurements obtained in a high numerical aperture (NA ~3.5) microscope. A technique to recover near-ideal imaging quality by compensating aberrations using a MEMS deformable mirror is described and demonstrated.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 28189-28197 |
| Number of pages | 9 |
| Journal | Optics Express |
| Volume | 21 |
| Issue number | 23 |
| DOIs | |
| State | Published - Nov 18 2013 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics