Absence of enhanced superconductivity in double-barrier superconducting tunnel junctions: Measurements of lateral electric transport in the middle normal-metal layer

I. P. Nevirkovets; O. Chernyashevskyy; J. B. Ketterson

doi:10.1103/PhysRevB.73.224521

Absence of enhanced superconductivity in double-barrier superconducting tunnel junctions: Measurements of lateral electric transport in the middle normal-metal layer

I. P. Nevirkovets^*, O. Chernyashevskyy, J. B. Ketterson

^*Corresponding author for this work

Physics and Astronomy

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6 Scopus citations

Abstract

The lateral conductivity of the middle Al layer of a Nb Al Al Ox Al Al Ox Al Nb (SINIS) multiterminal device is studied as a function of the current injected perpendicular to the layers in a regime where a gap-difference-like feature is observed in the current-voltage characteristic. The response of the Al layer does not confirm an earlier reported observation of superconductivity in the Al far above its transition temperature.

Original language	English (US)
Article number	224521
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	73
Issue number	22
DOIs	https://doi.org/10.1103/PhysRevB.73.224521
State	Published - Jun 30 2006

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.73.224521

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title = "Absence of enhanced superconductivity in double-barrier superconducting tunnel junctions: Measurements of lateral electric transport in the middle normal-metal layer",

abstract = "The lateral conductivity of the middle Al layer of a Nb Al Al Ox Al Al Ox Al Nb (SINIS) multiterminal device is studied as a function of the current injected perpendicular to the layers in a regime where a gap-difference-like feature is observed in the current-voltage characteristic. The response of the Al layer does not confirm an earlier reported observation of superconductivity in the Al far above its transition temperature.",

author = "Nevirkovets, {I. P.} and O. Chernyashevskyy and Ketterson, {J. B.}",

year = "2006",

month = jun,

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doi = "10.1103/PhysRevB.73.224521",

language = "English (US)",

volume = "73",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Physical Society",

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Absence of enhanced superconductivity in double-barrier superconducting tunnel junctions: Measurements of lateral electric transport in the middle normal-metal layer. / Nevirkovets, I. P.; Chernyashevskyy, O.; Ketterson, J. B.
In: Physical Review B - Condensed Matter and Materials Physics, Vol. 73, No. 22, 224521, 30.06.2006.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Absence of enhanced superconductivity in double-barrier superconducting tunnel junctions

T2 - Measurements of lateral electric transport in the middle normal-metal layer

AU - Nevirkovets, I. P.

AU - Chernyashevskyy, O.

AU - Ketterson, J. B.

PY - 2006/6/30

Y1 - 2006/6/30

N2 - The lateral conductivity of the middle Al layer of a Nb Al Al Ox Al Al Ox Al Nb (SINIS) multiterminal device is studied as a function of the current injected perpendicular to the layers in a regime where a gap-difference-like feature is observed in the current-voltage characteristic. The response of the Al layer does not confirm an earlier reported observation of superconductivity in the Al far above its transition temperature.

AB - The lateral conductivity of the middle Al layer of a Nb Al Al Ox Al Al Ox Al Nb (SINIS) multiterminal device is studied as a function of the current injected perpendicular to the layers in a regime where a gap-difference-like feature is observed in the current-voltage characteristic. The response of the Al layer does not confirm an earlier reported observation of superconductivity in the Al far above its transition temperature.

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DO - 10.1103/PhysRevB.73.224521

M3 - Article

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JF - Physical Review B - Condensed Matter and Materials Physics

IS - 22

M1 - 224521

ER -

Absence of enhanced superconductivity in double-barrier superconducting tunnel junctions: Measurements of lateral electric transport in the middle normal-metal layer

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