Absolute atomic-scale measurements of the Gibbsian interfacial excess of solute at internal interfaces

Bruce W. Krakauer*, David N. Seidman

*Corresponding author for this work

Research output: Contribution to journalArticle

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A method consistent with the Gibbs' formalism is presented for measuring the Gibbsian interfacial excess of solute (Γ) at an internal interface using atom-probe field-ion microscopy (APFIM). The values of Γ are measured directly, that is, without deconvolution procedures. The relationships between Γ and the thermodynamic-state variables of an internal interface are studied using the techniques of APFIM and transmission electron microscopy (TEM). Examples are given of the application of APFIM-TEM to the measurement of Γ at grain boundaries in an Fe(Si) alloy.

Original languageEnglish (US)
Pages (from-to)6724-6727
Number of pages4
JournalPhysical Review B
Issue number9
StatePublished - Jan 1 1993


ASJC Scopus subject areas

  • Condensed Matter Physics

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