Absolute atomic-scale measurements of the Gibbsian interfacial excess of solute at internal interfaces

Bruce W. Krakauer*, David N Seidman

*Corresponding author for this work

Research output: Contribution to journalArticle

120 Citations (Scopus)

Abstract

A method consistent with the Gibbs' formalism is presented for measuring the Gibbsian interfacial excess of solute (Γ) at an internal interface using atom-probe field-ion microscopy (APFIM). The values of Γ are measured directly, that is, without deconvolution procedures. The relationships between Γ and the thermodynamic-state variables of an internal interface are studied using the techniques of APFIM and transmission electron microscopy (TEM). Examples are given of the application of APFIM-TEM to the measurement of Γ at grain boundaries in an Fe(Si) alloy.

Original languageEnglish (US)
Pages (from-to)6724-6727
Number of pages4
JournalPhysical Review B
Volume48
Issue number9
DOIs
StatePublished - Jan 1 1993

Fingerprint

solutes
microscopy
probes
atoms
transmission electron microscopy
ions
grain boundaries
formalism
thermodynamics

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

@article{17be733229394835869e3502021a6f67,
title = "Absolute atomic-scale measurements of the Gibbsian interfacial excess of solute at internal interfaces",
abstract = "A method consistent with the Gibbs' formalism is presented for measuring the Gibbsian interfacial excess of solute (Γ) at an internal interface using atom-probe field-ion microscopy (APFIM). The values of Γ are measured directly, that is, without deconvolution procedures. The relationships between Γ and the thermodynamic-state variables of an internal interface are studied using the techniques of APFIM and transmission electron microscopy (TEM). Examples are given of the application of APFIM-TEM to the measurement of Γ at grain boundaries in an Fe(Si) alloy.",
author = "Krakauer, {Bruce W.} and Seidman, {David N}",
year = "1993",
month = "1",
day = "1",
doi = "10.1103/PhysRevB.48.6724",
language = "English (US)",
volume = "48",
pages = "6724--6727",
journal = "Physical Review B-Condensed Matter",
issn = "0163-1829",
publisher = "American Institute of Physics",
number = "9",

}

Absolute atomic-scale measurements of the Gibbsian interfacial excess of solute at internal interfaces. / Krakauer, Bruce W.; Seidman, David N.

In: Physical Review B, Vol. 48, No. 9, 01.01.1993, p. 6724-6727.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Absolute atomic-scale measurements of the Gibbsian interfacial excess of solute at internal interfaces

AU - Krakauer, Bruce W.

AU - Seidman, David N

PY - 1993/1/1

Y1 - 1993/1/1

N2 - A method consistent with the Gibbs' formalism is presented for measuring the Gibbsian interfacial excess of solute (Γ) at an internal interface using atom-probe field-ion microscopy (APFIM). The values of Γ are measured directly, that is, without deconvolution procedures. The relationships between Γ and the thermodynamic-state variables of an internal interface are studied using the techniques of APFIM and transmission electron microscopy (TEM). Examples are given of the application of APFIM-TEM to the measurement of Γ at grain boundaries in an Fe(Si) alloy.

AB - A method consistent with the Gibbs' formalism is presented for measuring the Gibbsian interfacial excess of solute (Γ) at an internal interface using atom-probe field-ion microscopy (APFIM). The values of Γ are measured directly, that is, without deconvolution procedures. The relationships between Γ and the thermodynamic-state variables of an internal interface are studied using the techniques of APFIM and transmission electron microscopy (TEM). Examples are given of the application of APFIM-TEM to the measurement of Γ at grain boundaries in an Fe(Si) alloy.

UR - http://www.scopus.com/inward/record.url?scp=4243951888&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4243951888&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.48.6724

DO - 10.1103/PhysRevB.48.6724

M3 - Article

VL - 48

SP - 6724

EP - 6727

JO - Physical Review B-Condensed Matter

JF - Physical Review B-Condensed Matter

SN - 0163-1829

IS - 9

ER -