Abstract
This paper presents an interpolation method that uses the contours of organs as the control parameters to recover the intensity information in the physical gaps of serial cross-sectional medical images. In this method, active contour models are used for generating the control lines required for the field morphing algorithm, which were previously manually specified. Contour information derived from this segmentation pre-process is then further processed and used as control parameters to warp the corresponding regions in both input data slices into compatible shapes. In this way, the reliability of correspondence to locate different segments of the same organs is improved and the intensity information for the interpolated intermediate slices can be derived more faithfully, To reduce the high time complexity for calculating the image warp in the field morphing process, a hierarchical decomposition process is proposed. In comparison with the existing intensity interpolation algorithms, which only consider corresponding points in a small physical neighborhood, this method warps the data images into similar shapes according to contour information to provide more meaningful correspondence relationships. The results show that this method generates more realistic and less blurred interpolated images especially when the local intensity variation is significant.
Original language | English (US) |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Publisher | Society of Photo-Optical Instrumentation Engineers |
Pages | 836-847 |
Number of pages | 12 |
Volume | 2622 |
Edition | 2 |
ISBN (Print) | 0819419869, 9780819419866 |
DOIs | |
State | Published - 1995 |
Event | Optical Engineering Midwest'95. Part 2 (of 2) - Chicago, IL, USA Duration: May 18 1995 → May 19 1995 |
Other
Other | Optical Engineering Midwest'95. Part 2 (of 2) |
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City | Chicago, IL, USA |
Period | 5/18/95 → 5/19/95 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering