Adhesive-Based Atom Probe Sample Preparation

Surya S. Rout, Philipp R. Heck, Nestor J Zaluzec, Dieter Isheim, Dean J Miller, David N Seidman

Research output: Contribution to journalArticle


We present a specimen preparation procedure for atom-probe tomography using SemGlu from Kleindiek Nanotechnik, an adhesive that hardens under electron beam irradiation. The SemGlu adhesive is used in place of focused-ion-beam-induced deposition of organo-metallic Pt, W, or C to form a bond between the sample and the substrate during the specimen preparation procedure. We demonstrate the utility of this adhesive-based specimen preparation technique with a correlated atom-probe tomography-scanning transmission electron microscopy study of the iron-nickel alloy kamacite (ferrite, ɑ-iron) in the Bristol iron meteorite and two steel specimens.
Original languageEnglish (US)
Pages (from-to)24-31
Number of pages8
JournalMiscroscopy Today
Issue number2
StatePublished - 2018


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