@inproceedings{d76f849020754704a68d7529b3852d7a,
title = "Advances and challenges in cryo ptychography at the Advanced Photon Source",
abstract = "Ptychography has emerged as a nondestructive tool to quantitatively study extended samples at a high spatial resolution. In this manuscript, we report on recent developments from our team. We have combined cryo ptychography and fluorescence microscopy to provide simultaneous views of ultrastructure and elemental composition, we have developed multi-GPU parallel computation to speed up ptychographic reconstructions, and we have implemented fly-scan ptychography to allow for faster data acquisition. We conclude with a discussion of future challenges in high-resolution 3D ptychography.",
keywords = "3D ptychography, cryogenic sample, fly scan, parallel computation, ptychography",
author = "J. Deng and Vine, {D. J.} and S. Chen and Nashed, {Y. S.G.} and Q. Jin and T. Peterka and S. Vogt and C. Jacobsen",
note = "Publisher Copyright: {\textcopyright} 2016 AIP Publishing LLC.; 12th International Conference on X-Ray Microscopy, XRM 2014 ; Conference date: 26-10-2014 Through 31-10-2014",
year = "2016",
month = jan,
day = "28",
doi = "10.1063/1.4937524",
language = "English (US)",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
editor = "{de Jonge}, {Martin D.} and Paterson, {David J.} and Ryan, {Christopher G.}",
booktitle = "XRM 2014",
}