Advances and challenges in cryo ptychography at the Advanced Photon Source

J. Deng, D. J. Vine, S. Chen, Y. S.G. Nashed, Q. Jin, T. Peterka, S. Vogt, C. Jacobsen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Ptychography has emerged as a nondestructive tool to quantitatively study extended samples at a high spatial resolution. In this manuscript, we report on recent developments from our team. We have combined cryo ptychography and fluorescence microscopy to provide simultaneous views of ultrastructure and elemental composition, we have developed multi-GPU parallel computation to speed up ptychographic reconstructions, and we have implemented fly-scan ptychography to allow for faster data acquisition. We conclude with a discussion of future challenges in high-resolution 3D ptychography.

Original languageEnglish (US)
Title of host publicationXRM 2014
Subtitle of host publicationProceedings of the 12th International Conference on X-Ray Microscopy
EditorsMartin D. de Jonge, David J. Paterson, Christopher G. Ryan
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735413436
DOIs
StatePublished - Jan 28 2016
Event12th International Conference on X-Ray Microscopy, XRM 2014 - Melbourne, Australia
Duration: Oct 26 2014Oct 31 2014

Publication series

NameAIP Conference Proceedings
Volume1696
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other12th International Conference on X-Ray Microscopy, XRM 2014
CountryAustralia
CityMelbourne
Period10/26/1410/31/14

Keywords

  • 3D ptychography
  • cryogenic sample
  • fly scan
  • parallel computation
  • ptychography

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Deng, J., Vine, D. J., Chen, S., Nashed, Y. S. G., Jin, Q., Peterka, T., Vogt, S., & Jacobsen, C. (2016). Advances and challenges in cryo ptychography at the Advanced Photon Source. In M. D. de Jonge, D. J. Paterson, & C. G. Ryan (Eds.), XRM 2014: Proceedings of the 12th International Conference on X-Ray Microscopy [020030] (AIP Conference Proceedings; Vol. 1696). American Institute of Physics Inc.. https://doi.org/10.1063/1.4937524