Advances in digital topography for characterizing imperfections in protein crystals

Jeffrey J. Lovelace, Cameron R. Murphy, Henry D. Bellamy, Keith Brister, Reinhard Pahl, Gloria E.O. Borgstahl*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    7 Scopus citations

    Abstract

    A system which joins digital topography with fine φ-sliced reflection profiling has been developed and applied to cryocrystallography. In this demonstration, fifteen fine φ-sliced reflection profiles with corresponding topographic sequences are evaluated: twelve reflections from a crystal at cryogenic temperatures and three reflections from a room-temperature crystal. The digitally collected data show results comparable with film, albeit at a lower resolution, but are acquired at a substantially higher rate. Additionally, anti-blooming circuitry in the CCD was tested and shown to provide useful data even when pixels were overloaded.

    Original languageEnglish (US)
    Pages (from-to)512-519
    Number of pages8
    JournalJournal of Applied Crystallography
    Volume38
    Issue number3
    DOIs
    StatePublished - Jun 2005

    ASJC Scopus subject areas

    • Biochemistry, Genetics and Molecular Biology(all)

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