Abstract
An atomic force microscope (AFM) based fast dynamic scanning indentation (DSI) nano-DMA method, which relies only on the commonly available capabilities of commercial AFMs to provide quantitatively accurate high-resolution (∼15 nm) spatial maps of local viscoelastic mechanical properties (E′, E″, and tan φ) in heterogeneous soft adhesive material systems, is described. The versatility of the DSI approach is demonstrated by successfully employing it on three industry-leading commercial AFMs/modules (Asylum's Cypher ES and MFP-3D Infinity AFMs with the FastForceMapping module, and Bruker's Dimension Icon AFM with the PeakForce QNM module). Frequency sweep thermorheological DSI experiments were performed to generate quantitatively accurate nano-DMA master curves spanning an unprecedented frequency range of 5 decades. Quantitative agreement between DSI nano-DMA and bulk DMA measurements is demonstrated for two different homogeneous elastomers (styrene butadiene rubber, SBR, and synthetic natural rubber, SNR). The capability of the DSI methodology in acquiring quantitatively accurate viscoelastic property maps of heterogeneous soft solids was validated through experiments on an SBR-SNR blend sample. Experimental factors affecting DSI data quality (e.g., shift factor and AFM tip size) are also discussed.
Original language | English (US) |
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Pages (from-to) | 8964-8978 |
Number of pages | 15 |
Journal | Macromolecules |
Volume | 51 |
Issue number | 21 |
DOIs | |
State | Published - Nov 13 2018 |
Funding
This work was funded by The Goodyear Tire & Rubber Company and made use of the EPIC and SPID facilities of Northwestern University’s NUANCE Center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1121262) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation; and the State of Illinois, through the IIN. This work was performed, in part, at the Duke University Shared Materials Instrumentation Facility (SMIF), a member of the North Carolina Research Triangle Nanotechnology Network (RTNN), which is supported by the National Science Foundation (Grant ECCS-1542015) as part of the National Nanotechnology Coordinated Infrastructure (NNCI). Gratuitous access to use Asylum MFP-3D AFM by Asylum Research/Oxford Instruments and the technical help of Mr. Keith Jones is gratefully acknowledged. M.D.E. acknowledges the support the Department of Defense (DoD) through the National Defense Science and Engineering Graduate (NDSEG) program. D.W.C. acknowledges financial support from Ryan Fellowship through the IIN at Northwestern University and a Fulbright Program grant sponsored by the Bureau of Educational and Cultural Affairs of the United States Department of State.
ASJC Scopus subject areas
- Organic Chemistry
- Polymers and Plastics
- Inorganic Chemistry
- Materials Chemistry