An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

M. R. Howells; T. Beetz; H. N. Chapman; C. Cui; J. M. Holton; C. J. Jacobsen; J. Kirz; E. Lima; S. Marchesini; H. Miao; D. Sayre; D. A. Shapiro; J. C H Spence; D. Starodub

doi:10.1016/j.elspec.2008.10.008

An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

M. R. Howells^*, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayre, D. A. Shapiro, J. C H Spence, D. Starodub

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

409 Scopus citations

Abstract

X-ray diffraction microscopy (XDM) is a new form of X-ray imaging that is being practiced at several third-generation synchrotron-radiation X-ray facilities. Nine years have elapsed since the technique was first introduced and it has made rapid progress in demonstrating high-resolution three-dimensional imaging and promises few-nanometer resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available X-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called "dose fractionation theorem" of Hegerl and Hoppe to calculate the dose needed to make an image of a single life-science sample by XDM with a given resolution. We find that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered otherwise. The conclusion of this study is that, based on the natural contrast between protein and water and "Rose-criterion" image quality, one should be able to image a frozen-hydrated biological sample using XDM at a resolution of about 10 nm.

Original language	English (US)
Pages (from-to)	4-12
Number of pages	9
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	170
Issue number	1-3
DOIs	https://doi.org/10.1016/j.elspec.2008.10.008
State	Published - Mar 2009

Funding

The authors are grateful to Dr. A. Vila-Sanjurjo and Prof. J. Cate for permission to use the ribosome crystal, to Prof. R.M. Glaeser for extended and valuable discussions and comments and to Dr. H.A. Padmore for sustained encouragement of this work. The Lawrence Berkeley National Laboratory authors and the Advanced Light source facility at Lawrence Berkeley National Laboratory are supported by the Director, Office of Energy Research, Office of Basics Energy Sciences, Materials Sciences Division of the U.S. Department of Energy, under Contract No. DE-AC03-76SF00098. J.M. Holton is additionally supported by National Institutes of Health (NIH) grant numbers 5U54 GM074929-02 and 1P50 GM082250-02. The work of the LLNL authors was performed under the auspices of the U.S. Department of Energy by University of California, Lawrence Livermore National Laboratory under Contract W-740740 5-Eng-48. The Stony Brook group has been supported by NIH grant number 1R01 GM64846-01, and by U.S. Department of Energy grant number DEFG0204ER46128. ASU work supported by NSF award IDBR 0555845.

Keywords

Coherent X-rays
Diffraction imaging
Dose fractionation
Frozen-hydrated samples
Radiation damage

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Radiation
Atomic and Molecular Physics, and Optics
Spectroscopy
Physical and Theoretical Chemistry

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10.1016/j.elspec.2008.10.008

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Howells, M. R., Beetz, T., Chapman, H. N., Cui, C., Holton, J. M., Jacobsen, C. J., Kirz, J., Lima, E., Marchesini, S., Miao, H., Sayre, D., Shapiro, D. A., Spence, J. C. H., & Starodub, D. (2009). An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy. Journal of Electron Spectroscopy and Related Phenomena, 170(1-3), 4-12. https://doi.org/10.1016/j.elspec.2008.10.008

@article{785afe60d59846dfa74413ad66e8570a,

title = "An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy",

abstract = "X-ray diffraction microscopy (XDM) is a new form of X-ray imaging that is being practiced at several third-generation synchrotron-radiation X-ray facilities. Nine years have elapsed since the technique was first introduced and it has made rapid progress in demonstrating high-resolution three-dimensional imaging and promises few-nanometer resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available X-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called {"}dose fractionation theorem{"} of Hegerl and Hoppe to calculate the dose needed to make an image of a single life-science sample by XDM with a given resolution. We find that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered otherwise. The conclusion of this study is that, based on the natural contrast between protein and water and {"}Rose-criterion{"} image quality, one should be able to image a frozen-hydrated biological sample using XDM at a resolution of about 10 nm.",

keywords = "Coherent X-rays, Diffraction imaging, Dose fractionation, Frozen-hydrated samples, Radiation damage",

author = "Howells, {M. R.} and T. Beetz and Chapman, {H. N.} and C. Cui and Holton, {J. M.} and Jacobsen, {C. J.} and J. Kirz and E. Lima and S. Marchesini and H. Miao and D. Sayre and Shapiro, {D. A.} and Spence, {J. C H} and D. Starodub",

note = "Funding Information: The authors are grateful to Dr. A. Vila-Sanjurjo and Prof. J. Cate for permission to use the ribosome crystal, to Prof. R.M. Glaeser for extended and valuable discussions and comments and to Dr. H.A. Padmore for sustained encouragement of this work. The Lawrence Berkeley National Laboratory authors and the Advanced Light source facility at Lawrence Berkeley National Laboratory are supported by the Director, Office of Energy Research, Office of Basics Energy Sciences, Materials Sciences Division of the U.S. Department of Energy, under Contract No. DE-AC03-76SF00098. J.M. Holton is additionally supported by National Institutes of Health (NIH) grant numbers 5U54 GM074929-02 and 1P50 GM082250-02. The work of the LLNL authors was performed under the auspices of the U.S. Department of Energy by University of California, Lawrence Livermore National Laboratory under Contract W-740740 5-Eng-48. The Stony Brook group has been supported by NIH grant number 1R01 GM64846-01, and by U.S. Department of Energy grant number DEFG0204ER46128. ASU work supported by NSF award IDBR 0555845.",

year = "2009",

month = mar,

doi = "10.1016/j.elspec.2008.10.008",

language = "English (US)",

volume = "170",

pages = "4--12",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "0368-2048",

publisher = "Elsevier B.V.",

number = "1-3",

}

Howells, MR, Beetz, T, Chapman, HN, Cui, C, Holton, JM, Jacobsen, CJ, Kirz, J, Lima, E, Marchesini, S, Miao, H, Sayre, D, Shapiro, DA, Spence, JCH & Starodub, D 2009, 'An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy', Journal of Electron Spectroscopy and Related Phenomena, vol. 170, no. 1-3, pp. 4-12. https://doi.org/10.1016/j.elspec.2008.10.008

TY - JOUR

T1 - An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

AU - Howells, M. R.

AU - Beetz, T.

AU - Chapman, H. N.

AU - Cui, C.

AU - Holton, J. M.

AU - Jacobsen, C. J.

AU - Kirz, J.

AU - Lima, E.

AU - Marchesini, S.

AU - Miao, H.

AU - Sayre, D.

AU - Shapiro, D. A.

AU - Spence, J. C H

AU - Starodub, D.

N1 - Funding Information: The authors are grateful to Dr. A. Vila-Sanjurjo and Prof. J. Cate for permission to use the ribosome crystal, to Prof. R.M. Glaeser for extended and valuable discussions and comments and to Dr. H.A. Padmore for sustained encouragement of this work. The Lawrence Berkeley National Laboratory authors and the Advanced Light source facility at Lawrence Berkeley National Laboratory are supported by the Director, Office of Energy Research, Office of Basics Energy Sciences, Materials Sciences Division of the U.S. Department of Energy, under Contract No. DE-AC03-76SF00098. J.M. Holton is additionally supported by National Institutes of Health (NIH) grant numbers 5U54 GM074929-02 and 1P50 GM082250-02. The work of the LLNL authors was performed under the auspices of the U.S. Department of Energy by University of California, Lawrence Livermore National Laboratory under Contract W-740740 5-Eng-48. The Stony Brook group has been supported by NIH grant number 1R01 GM64846-01, and by U.S. Department of Energy grant number DEFG0204ER46128. ASU work supported by NSF award IDBR 0555845.

PY - 2009/3

Y1 - 2009/3

N2 - X-ray diffraction microscopy (XDM) is a new form of X-ray imaging that is being practiced at several third-generation synchrotron-radiation X-ray facilities. Nine years have elapsed since the technique was first introduced and it has made rapid progress in demonstrating high-resolution three-dimensional imaging and promises few-nanometer resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available X-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called "dose fractionation theorem" of Hegerl and Hoppe to calculate the dose needed to make an image of a single life-science sample by XDM with a given resolution. We find that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered otherwise. The conclusion of this study is that, based on the natural contrast between protein and water and "Rose-criterion" image quality, one should be able to image a frozen-hydrated biological sample using XDM at a resolution of about 10 nm.

AB - X-ray diffraction microscopy (XDM) is a new form of X-ray imaging that is being practiced at several third-generation synchrotron-radiation X-ray facilities. Nine years have elapsed since the technique was first introduced and it has made rapid progress in demonstrating high-resolution three-dimensional imaging and promises few-nanometer resolution with much larger samples than can be imaged in the transmission electron microscope. Both life- and materials-science applications of XDM are intended, and it is expected that the principal limitation to resolution will be radiation damage for life science and the coherent power of available X-ray sources for material science. In this paper we address the question of the role of radiation damage. We use a statistical analysis based on the so-called "dose fractionation theorem" of Hegerl and Hoppe to calculate the dose needed to make an image of a single life-science sample by XDM with a given resolution. We find that the needed dose scales with the inverse fourth power of the resolution and present experimental evidence to support this finding. To determine the maximum tolerable dose we have assembled a number of data taken from the literature plus some measurements of our own which cover ranges of resolution that are not well covered otherwise. The conclusion of this study is that, based on the natural contrast between protein and water and "Rose-criterion" image quality, one should be able to image a frozen-hydrated biological sample using XDM at a resolution of about 10 nm.

KW - Coherent X-rays

KW - Diffraction imaging

KW - Dose fractionation

KW - Frozen-hydrated samples

KW - Radiation damage

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JO - Journal of Electron Spectroscopy and Related Phenomena

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ER -

An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

Abstract

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Keywords

ASJC Scopus subject areas

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