An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

M. R. Howells*, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. J. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayre, D. A. Shapiro, J. C H Spence, D. Starodub

*Corresponding author for this work

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