An Improved Independent Increment Process Degradation Model with Bilinear Properties

Zhihua Wang, Jiangming Cao, Xiaobing Ma*, Huayong Qiu, Yongbo Zhang, Huimin Fu, Sridhar Krishnaswamy

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Fingerprint

Dive into the research topics of 'An Improved Independent Increment Process Degradation Model with Bilinear Properties'. Together they form a unique fingerprint.

Engineering

Mathematics

Physics

INIS