An undulator based scanning microscope at the national synchrotron light source

H. Rarback, D. Shu, H. Ade, C. Jacobsen, J. Kirz, I. McNulty, R. Rosser

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A second generation scanning soft x-ray microscope is under construction, designed to utilize the dramatic increase in source bightness available at the soft x-ray undulator. The new instrument is expected to reduce image acquisition time by a factor of about 100, and to improve resolution, stability, and reproducibility.

Original languageEnglish (US)
Pages (from-to)107-110
Number of pages4
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume691
DOIs
StatePublished - Aug 12 1986

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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