An X-ray study of domain structure and stress in Pd₂Si films at Pd-Si interfaces

Keyphrases

• Domain Structure 100%
• Silicon Substrate 100%
• X-ray Study 100%
• Pd2Si 100%
• Si(111) 66%
• X Ray Diffraction 33%
• Plastic Deformation 33%
• X-ray Diffraction Method 33%
• Palladium 33%
• Rocking Curve 33%
• Pole Figure 33%
• Silicide 33%
• Crystallographic Relationship 33%
• X-ray Diffraction Topography 33%
• Silicide Formation 33%

Material Science

• Film 100%
• X-Ray Diffraction 100%
• Silicon 100%
• Silicide 66%
• Diffraction Measurement 33%
• Palladium 33%
• Plastic Deformation 33%
• Diffraction Topography 33%

Physics

• X Ray 100%
• X Ray Diffraction 100%
• Plastic Deformation 33%
• Diffraction Topography 33%