Analysis of defects on BN nano-structures using high-resolution electron microscopy and density-functional calculations

Erman Bengu*, Laurence Marks, Rasim V. Ovali, Oguz Gulseren

*Corresponding author for this work

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

Cubic boron nitride (c-BN) nucleation takes place on hexagonal boron nitride (h-BN) layers growing perpendicular to the substrate surface during thin film synthesis. Studies focused on the nucleation of the cubic phase suggest the possibility that transient phases and/or defects on these h-BN structures have a role in sp3-bonded cubic phase nucleation. In this study, we have investigated the nature, energetics, and structure of several possible defects on BN basal planes, including point defects, 4-, and 5-fold BN rings, that may possibly match the experimentally observed transient phase fine structure. TEM image observations are used to build approximate atomic models for the proposed structures, and DFT calculations are used to relax these structures while minimizing their respective total energies. These optimized atomic geometries are then used to simulate TEM images, which are compared to the experimentally observed structures. Data from DFT calculations and analysis of simulated images from the proposed atomic structures suggest that 4-fold BN rings are more likely to exist on the transient phase possibly leading to c-BN nucleation.

Original languageEnglish (US)
Pages (from-to)1484-1489
Number of pages6
JournalUltramicroscopy
Volume108
Issue number11
DOIs
StatePublished - Oct 1 2008

Keywords

  • Fullerenes and related materials
  • Interfaces and thin films
  • Microscopy of surfaces
  • Models of film growth
  • Total energy and cohesive energy calculations

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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