Analysis of mode characteristics for equilateral triangle semiconductor microlasers with imperfect boundaries

Y. Z. Huang*, Q. Y. Lu, W. H. Guo, L. J. Yu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

The influence of imperfect boundaries on the mode quality factor is investigated for equilateral-triangle-resonator (ETR) semiconductor microlasers by the finite difference time domain technique and the Padé approximation with Baker's algorithm. For 2-D ETR with a refractive index of 3.2 and side length of 5 μm, the confined modes can still have a quality factor of about 1000 as small triangles with side length of 1 μm are cut from the vertices of the ETR. For a deformed 5 μm ETR with round vertices and curve sides, the simulated mode quality factors are comparable to the measured results.

Original languageEnglish (US)
Pages (from-to)202-204
Number of pages3
JournalIEE Proceedings: Optoelectronics
Volume151
Issue number4
DOIs
StatePublished - Aug 1 2004

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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