Analysis of reliability mappings for reliability-based incremental redundancy

Eugene Visotsky, Yakun Sun, Michael L. Honig, Vinayak Tripathi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of 2004 IEEE International Symposium on Information Theory
State	Published - 2004
Event	Proceedings of 2004 IEEE International Symposium on Information Theory - Chicago, IL Duration: Jun 27 2004 → …

Conference	Proceedings of 2004 IEEE International Symposium on Information Theory
Period	6/27/04 → …

Cite this

@inproceedings{2fdb551071f8429eb5c2d1fd7744537e,

title = "Analysis of reliability mappings for reliability-based incremental redundancy",

author = "Eugene Visotsky and Yakun Sun and Honig, {Michael L.} and Vinayak Tripathi",

year = "2004",

language = "English",

booktitle = "Proceedings of 2004 IEEE International Symposium on Information Theory",

note = "null ; Conference date: 27-06-2004",

}