Abstract
We have grown Bi and BiSb alloy thin films on (211)CdTe substrates by molecular beam epitaxy. Growth proceeds with the Bi or BiSb (00.1) axis oriented along the CdTe[111] direction, which is tilted by 19o with respect to the substrate normal. Measurements of the Seebeck coefficient reveal a strong dependence on angle within the plane, due to the anisotropic electronic structure. The coefficient measured along the [1̄11] axis, which includes a trigonal contribution from the Seebeck tensor, is considerably higher than the value along the [011̄] axis. The magneto-Seebeck coefficient was also studied, for magnetic fields of 0-0.7 T. We observe a strong dependence on both crystal-axis and magnetic field direction, the so-called "umkehr" effect.
Original language | English (US) |
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Pages (from-to) | 808-812 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 88 |
Issue number | 2 |
DOIs | |
State | Published - Jul 15 2000 |
ASJC Scopus subject areas
- General Physics and Astronomy