Apodization techniques for spurious mode suppression in 900 MHz aluminum nitride contour-mode resonators

Marco Giovannini*, Serkan Yazici, Nai Kuei Kuo, Gianluca Piazza

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper reports, for the first time, on the application of apodization techniques to 900 MHz MEMS AlN Contour-Mode Resonators (CMRs [1]) to efficiently suppress spurious modes in close proximity of the main mechanical resonance. This concept has been applied with excellent results to a variety of one port resonators formed by patterned top electrodes made out of Aluminum, and a floating bottom electrode made out of Platinum sandwiching the AlN film. As also predicted by 3D COMSOL simulations, a complete elimination of spurious responses in the admittance plot of these resonators is attained without impacting their Q or electromechanical coupling coefficient, kt 2.

Original languageEnglish (US)
Title of host publication2012 Solid-State Sensors, Actuators and Microsystems Workshop, Hilton Head 2012
EditorsMehran Mehregany, David J. Monk
PublisherTransducer Research Foundation
Pages351-354
Number of pages4
ISBN (Electronic)9780964002494
DOIs
StatePublished - 2012
Externally publishedYes
Event2012 Solid-State Sensors, Actuators and Microsystems Workshop, Hilton Head 2012 - Hilton Head, United States
Duration: Jun 3 2012Jun 7 2012

Publication series

NameTechnical Digest - Solid-State Sensors, Actuators, and Microsystems Workshop

Conference

Conference2012 Solid-State Sensors, Actuators and Microsystems Workshop, Hilton Head 2012
Country/TerritoryUnited States
CityHilton Head
Period6/3/126/7/12

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Hardware and Architecture

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