Application of x-ray microtomography in materials science illustrated by a study of a continuous fiber metal matrix composite

J. C. Elliott, P. Anderson, G. Davis, S. D. Dover, S. R. Stock, T. M. Breunig, A. Guvenilir, S. D. Antolovich

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

The advantages of the use of x-ray microtomography in materials science are discussed, and illustrated by the nondestructive study of the mechanical damage in a continuous fiber SiC/Al composite at a resolution of about 25 μm. A laboratory x-ray source was used, and it was shown that quantitative measurements of the linear absorption coefficient at this resolution are possible, even though the AgKα radiation used is accompanied by a considerable amount of white radiation, provided that the counter system is properly corrected for pulse pile up and dead-time.

Original languageEnglish (US)
Pages (from-to)249-258
Number of pages10
JournalJournal of X-Ray Science and Technology
Volume2
Issue number4
DOIs
StatePublished - 1990

ASJC Scopus subject areas

  • Radiation
  • Instrumentation
  • Radiology Nuclear Medicine and imaging
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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