Application software for data analysis for three-dimensional atom probe microscopy

Olof Hellman, Justin Vandenbroucke, John Blatz Du Rivage, David N. Seidman*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

66 Scopus citations

Abstract

We present a custom MacOS-based application, ADAM, for analysis of data collected by a three-dimensional atom probe (3DAP). The application is designed to carry out a common set of analysis tasks, to be customizable, to provide easy export and import of data, and to be simple enough for novice users to understand quickly. The integration of both graphical (GUI) and scripting (SUI) user interfaces and the functionality accessible from both is discussed. Different types of visualization can be used for best presentation of 3DAP data.

Original languageEnglish (US)
Pages (from-to)29-33
Number of pages5
JournalMaterials Science and Engineering A
Volume327
Issue number1
DOIs
StatePublished - Apr 15 2002

Keywords

  • Atom probe-data analysis
  • Software for atom-probe analysis
  • Three-dimensional atom probe

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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