Applications and instrumentation advances with the Stony Brook scanning transmission X-ray microscope

Michael Feser*, Mary Carlucci-Dayton, Chris Jacobsen, Janos Kirz, Ulrich Neuhäusler, Graham Smith, Bo Yu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

27 Scopus citations

Abstract

Scanning transmission X-ray microscopes (STXM) are well matched to the optics of high resolution monochromators, offer a variety of imaging modes and can minimize radiation damage to the specimen. We describe the Stony Brook STXM at the NSLS. This microscope is used for a variety of studies by many users; we briefly outline its use for studies of hydrated colloidal systems and for dark field microscopy on immnnogold labeled specimens as examples. In order to keep pace with developments in zone plate optics, spectroscopy and a variety of imaging modalities, the microscope is being redesigned and its characteristics are discussed. Its primary x-ray detector will be a new multiwire proportional counter with high count rate capability.

Original languageEnglish (US)
Pages (from-to)19-29
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3449
DOIs
StatePublished - 1998
EventX-Ray Microfocusing: Applications and Techniques - San Diego, CA, United States
Duration: Jul 22 1998Jul 23 1998

Keywords

  • Dark field microscopy
  • Proportional counter
  • Soft x-ray microscopy
  • Spectromicroscopy
  • X-ray microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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