Applications of Electron Microscopy in Heterogeneous Catalysis

Yuyuan Lin*, James A. McCarthy, Kenneth R. Poeppelmeier, Laurence D. Marks

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Scopus citations


Transmission electron microscopy (TEM) is a convenient technique for catalyst characterization. A variety of structural and chemical information of catalysts can be obtained by operating TEM in different modes. The recent developments in TEM, particularly for the aberration corrections, enable studying catalyst at the atomic scale. We briefly cover the TEM theory, developments, and other important topics at the beginning. Several case studies of using TEM as a tool to study the catalysts with well-defined structures are provided later in the chapter. The examples in case studies include atomic surface structures of oxide supports, shapes of supported metals in both vacuum and gaseous conditions, bimetallic catalysts, and single atom catalysts. In each case, the underlying mechanisms of catalytic behaviors are briefly discussed based on the results derived from TEM and other studies.

Original languageEnglish (US)
Title of host publicationCatalysis by Materials with Well-Defined Structures
PublisherElsevier Inc
Number of pages46
ISBN (Electronic)9780128013403
ISBN (Print)9780128012178
StatePublished - Apr 2 2015


  • Aberration correction
  • Atomic surface structures
  • ETEM
  • HREM
  • Heterogeneous catalysis
  • Nanoparticles
  • STEM
  • TEM
  • Well-defined catalyst

ASJC Scopus subject areas

  • General Engineering
  • General Chemical Engineering


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