Assessing the impact of fundamental scanning tunneling microscopy studies on VLSI technology

M. C. Hersam, N. P. Guisinger, J. W. Lyding

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 9th NASA Symposium on VLSI Design
StatePublished - 2000
EventProceedings of the 9th NASA Symposium on VLSI Design -
Duration: Jan 1 2000 → …

Conference

ConferenceProceedings of the 9th NASA Symposium on VLSI Design
Period1/1/00 → …

Cite this

Hersam, M. C., Guisinger, N. P., & Lyding, J. W. (2000). Assessing the impact of fundamental scanning tunneling microscopy studies on VLSI technology. In Proceedings of the 9th NASA Symposium on VLSI Design