Atom probe analysis and modelling of interfaces in magnetic multilayers

Amanda K. Petford-Long*, Alfred Cerezo, Jonathan M. Hyde

*Corresponding author for this work

Research output: Contribution to journalArticle

16 Scopus citations

Abstract

The nature of the interfaces in metallic multilayer films (MLF) has a profound effect on their magnetic properties. We have used atom probe microanalysis and Monte Carlo modelling to follow changes in interface profile during annealing in Co/Ni and Fe/Cr layered films. The aim is to understand the interface kinetics, and thus to tailor specimen processing to produce the optimum interfaces for each magnetic application. Experimental results showed that annealing for 1 h at 300°C extended the interfacial mixing in Co/Ni films from two atomic layers to 1 nm. Modelling of ageing in Co/Ni films showed a similar increase in interfacial thickness, whilst modelling of ageing in Fe/Cr films increased the interface sharpness by an "interface spinodal" reaction.

Original languageEnglish (US)
Pages (from-to)367-374
Number of pages8
JournalUltramicroscopy
Volume47
Issue number4
DOIs
StatePublished - Dec 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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